Improving board and system test: a proposal to integrate boundary scan and I/sub DDQ/
D. Reed, J. Doege, Antonio Rubio · 2002
I/sub DDQ//I/sub SSQ/ testing has been a popular topic for production testing of CMOS integrated circuits (ICs). Although this type of testing shows promise for board and system level testing, there exist limitations in the implementation of such testing. This paper proposes integrating boundary scan and I/sub DDQ/ testing at the integrated circuit level so that I/sub DDQ/ testing can be accomplished at the board and system level for improved system reliability.