An investigation of response surfaces among process, device and circuit using analytical model
N. Shigyo · 2002
This article analyzes the process-to-device and device-to-circuit response surfaces using an analytical model to investigate the definition of the worst-case circuit models. It is found that the worst-cases for L, t/sub ox/ and N/sub chn/ corresponded to those for the propagation delay /spl tau//sub pd/ of a ring oscillator.