An efficient, bus-layout based method for early diagnosis of bussed driver shorts in printed circuit boards
Kanad Chakraborty, Pinaki Mazumder · 1996
This paper presents a new, layout-based approach to board-level shorts diagnosis for bussed drivers, with the goal of early repair of interconnect shorts so as to mini-mize (a) fault masking during opens testing and (b) driver abuse. This approach leads to an early diagnosis of more than 96 % of shorts and simplifies the subsequent test for opens considerably. Besides, this approach improves the production yield and field survivability of boards. Key words and phrases: Short, open, parallel test vec-tor (PTV).