Φ-test: Perfect hashed index test for test response validation
Rajiv Gupta · 2002
A scheme called /spl Phi/-test for checking the fidelity of test responses generated by a specially tailored sequence of test inputs is described. /spl Phi/-test, which performs the checks without storing the test responses in any manner, can be used for fault diagnosis and isolation in (1) embedded combinational or sequential logic, and (2) a system of units connected via a bus. Unlike signature analysis, /spl Phi/-test flags the offending values in case of discrepancy, thereby exposing the test inputs (and by implication, the devices) that generated them.>