A memory specific notation for fault modeling
Zaid Al-Ars, A.J. van de Goor, J. Braun, D. Richter · 2002
This paper shows the shortcomings of the current, generic notation for fault models and extends it to allow the description of fault models for DRAMs. The advantage is that the extended fault models can easily be translated into operation sequences and tests that detect the described fault. Examples are given to show that the new notation results in optimized, memory specific, tests that have a shorter run time for a given fault coverage.