TID and SEE Tests of an Advanced 8 Gbit NAND-Flash Memory
H. Schmidt, Dietmar Walter, F. Gliem, Bob Nickson, R. Harboe-Sørensen, Ari Virtanen · 2008
We report on the dose and operational mode dependence of error percentage, stand-by current, erase and write time of 8 Gbit / 4 Gbit NAND-flash memories as well as on their static, dynamic and SEFI cross sections.