A novel method of improving transition delay fault coverage using multiple scan enable signals
Narendra Devta-Prasanna, Arun Gunda, Prabhu Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz · 2006
We propose a novel delay test method for achieving higher delay fault coverage. Multiple scan enable signals are used none of which require the ability to switch at-speed between launch and capture cycles.