Multiple weighted cellular automata
D.J. Neebel, Charles R. Kime · 2002
Presents a complete design method for inhomogeneous cellular automata capable of generating BIST patterns with multiple weight sets at a test per clock rate. The method achieves 100% stuck-at fault coverage of detectable faults for almost all combinational benchmark circuits having random pattern resistant faults. The authors also present data showing the overall speed up relative to test per scan methods.>