Test suite generation methods for concurrent systems based on coloured Petri nets
H. Watanabe, Takashi Kudoh · 2002
Automatic generation of test suites for concurrent systems is a newly exploited area of conformance tests. A few methods based on a finite state machine (FSM) have been proposed. However, these methods require a large amount of computation cost. By using coloured Petri nets (CPN), the required amount of computation costs can be reduced, and the length of the test suites can be reduced by using the equivalent marking technique on CPN. In addition, these methods allow us to test interaction parameters of concurrent systems. We propose two CPN based test suite generation methods for conformance tests: the coloured Petri net tree (CPT) method and the coloured Petri net graph (CPG) method. An experimental test suite generator (TSG) based on CPT method is presented. To show the advantages of the CPT and CPG methods, the effects of test suite length reduction by equivalent markings are evaluated.