Reliability Study of Single Stage Multi-Input Majority Function for QCA
Esam Alkaldy, Keivan Navi · International Journal of Computer Applications · 2013
Due to the physical limitations faced by CMOS (Complementary Metal Oxide Semiconductor) scaling many technologies were suggested to replace CMOS on the nanoscale.Most of the suggested technologies are not deterministic and follow the Law of Large Number LLN.So, the reliability inspection is essential to these technologies.In this paper the PTM (Probabilistic Transfer Matrix) is used to inspect the reliability of multi-input majority function for QCA (Quantum dot-Cellular Automata).This study conclude that the single-gate with multi-input Majority has the same reliability of its 3-input form.To extend the results to digital circuits, the full adder is used as a test bench.The results show the superiority of the full adder version designed with 5input majority gate upon other designs from reliability point of view.