Design for testability for SoC based on IDDQ scanning
Miljana Sokolović, Predrag M. Petković, Vanco B. Litovski · 2008
One DFT solution for systems on chip, based on IDDQ measuring concept is presented in this paper. The application of Reconfigurable neurai networks off chip enables also good diagnostics capabilities. The solution is to be implemented in few digital blocks of the tree phase power meter IC and realized using CMOS035 technology. The simulation results obtained using Cadence Virtuoso show good performances of the solution.