FAULT DIAGNOSIS IN ANALOG ELECTRONIC CIRCUITS - THE SVM APPROACH
Damian E. Grzechca, Jerzy Rutkowski · 2009
In this paper, the application of the SVM (Support Vector Machine) algorithm has been used for diagnosis and tests of analog electronic circuits. The diagnosis procedure belongs to simulation-before-test techniques, where simulations of the circuit under test (CUT) are performed at the before-test stage. Two examples have been verified for parametric and catastrophic faults in the time domain, but the conclusion is driven with the use of assumed features. A fault-driven test (FDT) has been applied to a filter circuit and a specification-driven test (SDT) to a field-programmable analog array (FPAA). The SVM classifies features which are calculated from the time domain responses. Results obtained from the examples prove a high detection and localization level of circuit states with the use of the SVM classifier.