A novel algorithm to extract two-node bridges
Sujit T. Zachariah, Sreejit Chakravarty, Carl D. Roth · 2000
Defect based testing is based on the premise that it is possible to extract high probability defects viz. bridges and opens using layout and defect data. We present a very efficient algorithm to extract two-node bridges from layout. Comparison results with a popular tool show that our algorithm is considerably faster and that it has higher capacity.