A test methodology to support an ASEM MCM foundry
Thomas M. Storey, C. Lapihuska, Eugene Atwood, L.-S. Su · 2002
MCM testing can be challenging enough when the chip, substrate, and MCM design are within the control of the same company. In the foundry environment, however, even more robust strategies must be adopted. In this paper a test methodology is described which consolidates the various MCM test stages to form a flexible, low-cost, quick turn-around-time test flow.