A unified approach to image feature detection using finite state machines
Athula Ginige · International Conference on Image Processing · 1992
Feature detection is an important phase in image processing applications. Basic image features are comprised of lines and edges. At present there are many algorithms capable of detecting lines or edges. Yet there is no single algorithm that can detect both of these image features. Thus for a particular application if different features need to be detected, different algorithms need to be used resulting in an inefficient system. This new algorithm based on finite state machines (FSMs) overcomes this drawback. This new algorithm combines two previously developed FSM based algorithms for line detection and edge detection. >