Integrating design information for IC diagnosis
Stefano Concina, G. S. Liu · 1987
This paper focuses on the data structures and algorithms used in an integrated electron-beam probing system for IC diagnosis. This goal is to create an effective debugging environment through access to various types of design information. Dedicated databases permit separate schematics and layouts to be cross referenced on line. Special algorithms deliver fast, interactive performance by capitalizing on design hierarchies.