Properties of continuous analog estimators for a discrete reliability-growth model
G. K. Bhattacharyya, Arthur Fries, Reid A. Johnson · IEEE Transactions on Reliability · 1989
A discrete reliability-growth model (appropriate for success-failure data) whose derivation parallels that of a popular nonhomogeneous Poisson process model (appropriate for continuous failure time data) is considered.,Following J. M. Finkelstein (ibid. vol.R-32, p.508-11, Dec. 1983) continuous analog estimators are defined for use with the discrete model when there is a constant prespecified number of test trials between system configuration changes. The large-sample properties of these estimators, including consistency and normality, are established. Large-sample standard-error formulas and confidence interval procedures are developed.>