Configuring arithmetic pattern generators and response compactors from the RT-modules of a circuit
F. Mayer, Albrecht P. Stroele · 2002
In recent years, accumulators have been shown to be efficient pattern generators and response compactors for built-in self-test. Many circuits contain modules which can be configured as accumulators just by controlling these modules adequately. This paper presents algorithms that find all possible accumulator configurations in a circuit and optimize the control of the accumulator test application or or inexpensive test control implementation.