Node-fault diagnosis and a design of testability
Zhiqiu Huang, Chen-Huey Lin, Ruixian Liu · IEEE Transactions on Circuits and Systems · 1983
A concept ofk-node-fault testability is introduced. A sufficient and almost necessary condition for testability as well as the test procedure is presented. This condition is further evolved to a necessary and almost sufficient topological condition for testability. A unique feature of this condition is that it depends only on the graph of the circuit, not on the element values. Based on this condition, a design of testability can be established.