Levelized low cost delay test compaction considering IR-drop induced power supply noise
Zhongwei Jiang, Zheng Wang, Jing Wang, D.M.H. Walker · 2011
Power supply noise is very important in delay testing. Excessive noise can cause circuit delay increases that lead to test overkill. Test patterns that are too quiet can lead to test escapes. In this work, we introduce a realistic low cost delay test compaction flow that guardbands circuit delay during test using a sequence of estimation metrics. Significant reductions in CPU time are demonstrated over prior work.