Self-checking and fault tolerant approaches can help BIST fault coverage: a case study
Fulvio Corno, P. Prinetto, Matteo Sonza Reorda · PORTO Publications Open Repository TOrino (Politecnico di Torino) · 1996
Summary form only given. We describe the design of an FIFO component with BIST capabilities. The component is now being used in the Italtel standard library and is exploited in several industrial designs. Our main contribution is to show how the effectiveness of complex BIST design can be improved, and brought to acceptable fault coverage levels, through the coupling with more advanced test architectures developed for online testing schemes. We adopted fault tolerant schemes and self-checking components to ensure that critical circuitry is working correctly.