Increasing test throughput through the implementation of parallel test on a 16-bit multimedia audio codec
Harold Bogard, Celeste Repasky · 2002
The cost of test is one of the most pressing issues faced by the semiconductor industry today. One important method for reducing the cost of testing is parallel test. Parallel test has been used successfully for many years for digital logic, memory, and analog integrated circuits, but is only now gaining popularity in the mixed signal industry. This paper explores the issues involved when deciding to use parallel test and describes the implementation of parallel test for a high performance, stereo, multimedia audio codec. Test time improvement and performance results are presented.