The boundary-scan master: target applications and functional requirements
Chi W. Yau, Najmi Jarwala · 2002
The need for a parallel-serial bus interface chip (BSM) which supports the boundary-scan architecture is demonstrated. Various external and embedded applications for the BSM are identified. The external applications include low-cost testers and other trouble-shooting instruments, such as in-circuit emulators. The embedded applications encompass board- and system-level test and diagnostic support functions. For the embedded applications, further distinction is made between centralized and distributed test and diagnostic control mechanisms. A comprehensive list of requirements which support the BSM's target applications is specified. A subset of the requirements is defined after a detailed design tradeoff analysis. It is demonstrated that, with the final feature set the BSM is able to meet the cost-performance, goals dictated by the anticipated applications.>