Comparison of voltage and current testing of analogue and mixed-signal circuits
Mahmoud Al‐Qutayri · 2002
The author presents a time-domain testing technique for analogue and mixed-signal circuits. The circuit-under-test (CUT) is simulated by a pseudo-random-binary sequence (PRBS) signal and both the voltage and supply current (Iddq) responses are measured. Both measurements are subsequently analyzed to detect the presence of a fault and to establish which measurement achieves higher confidence in the detection. The technique can test mixed-signal circuits in a unified manner and detecting soft and catastrophic faults.>