Self-testing second-order delta-sigma modulators using digital stimulus
Chee-Kian Ong, Kwang-Ting Tim Cheng · 2003
Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is difficult to generate. This paper proposes a novel and robust technique to determine the performance of the modulator, which incorporates simple design-for-testability circuitry. This technique requires only digital stimulus to test the modulator. Hence, it is suitable as an analog signature analyzer used in built-in self-test applications. Simulation results show that this technique is capable of accurately determining the performance of a second-order delta-sigma modulator ADC.