The use of variable load for RF circuit testing
Piotr Kyziol, Damian E. Grzechca, Tomasz Golonek, Jerzy Rutkowski · 2008
The testing and diagnosis catastrophic faults technique for analog high frequency (HF) circuits (passive filters and impedance matching circuits) is described in this paper. The novel method based on load and frequency as testing pair has been proposed. The impact of load on testing and diagnostic has been investigated. The best pairs of load and frequency have been chosen. The proposed approach of testing analog HF circuits allows to increase diagnostic CUT with catastrophic faults and tolerance dispersion. The testing method has been checked for impedance matching circuit from RFID HF reader.