Test Data Compression Using Dictionaries with Fixed-Length Indices
Lei Li, Krishnendu Chakrabarty · 2007
We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. Thep opl65 method is based on the use of a small number of ATE channels to delivercomp essed testpstl1 ns from the tester to thechip and to drive a large number of internal scan chains in the circuit under test. Therefore, it isesp767lM2 suitable for a reduced pcedl772 and low-cost DFT test environment, where a narrow interface between the tester and the SOC is desirable. The dictionary-basedapt oach not only reduces testing time but it also eliminates the need for additional synchronization and handshaking between the SOC and the ATE. The dictionary entries are determined during thecomp essionp ocedure by solving a variant of the well-known cliquepquel50411l p oblem fromgrap theory. Exp782lM0749 esults for the ISCAS-89 benchmarks and rep esentative test data from IBM show that thep opl59 method outperforms a number of recently-p opent test data compression techniques.