Design and synthesis of built-in self-testable two-dimensional discrete cosine transform circuits
Han Bin Kim, Dong Sam Ha · 2002
We present design of a two-dimensional (2-D) discrete cosine transform (DCT) circuit with built-in self-test (BIST) capability. After modifying an existing fast 2-D DCT algorithm to make it more flexible, we synthesized the data path and the controller using our high-level BIST synthesis tool and incorporated scan design in other modules. Our design achieves high fault coverage at small cost of area overhead and system performance degradation.