PODEM-X: An automatic test generation system for VLSI logic structures
Prabhakar Goel, Barry C. Rosales · 1981
Mult iple test generat ion algorithms and techniques described in this paper have been integrated into a unified system which has successful ly produced tests for unpart it ioned LSSD logic structures of up to 50,000 logic gates. The design concepts behind the creation of a unified system are presented, as are actual results obtained on large logic structures. System usabi l i ty was signif icantly enhanced by the same concepts that faci l i tated the integration of mult iple algorithms and techniques.