Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary
Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy, Huaxing Tang · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 2007
In this paper we present a new technique to speed up the effect-cause defect diagnosis by using a dictionary of very small size. In the proposed method, a dictionary of small size is used to reduce the number of events (gate evaluations) during the simulation of failing patterns and also a procedure to select a subset of passing patterns for simulation. Although the dictionary size is smaller, experimental results show speed up of effect-cause diagnosis by up to 156times. Experimental results from industrial designs validate the effectiveness of the proposed method.