RTL concurrent fault simulation
Li Shen · 2003
The integrated circuit (IC) design has been pushed to hardware description language (HDL) description and high-level synthesis (HLS) techniques. The IC testing is also going to the high-level one. For the high-level testing, like gate level one, it needs a circuit model at high level such that, The model is easy to be converted and extended from the HDL descriptions. The model should be unified for multiple usages such as fault simulation, test generation, testability measure, etc. For various algorithms, it is easy to perform forward and backward tracing on the model, and easy to define fault models. In this paper, we try to construct such model and apply it to the fault simulation first.