Hamming count-a compaction testing technique
Anita Gleason, Wen B. Jone · 2003
A signature compaction method called Hamming count (H-count) is introduced. H-count is similar to a reduced Walsh spectral coefficient test, and encompasses all syndrome testable faults. H-count has both a lower masking probability and a simpler circuit design than the index vector test. The method provides an efficient and effective compaction technique.>