Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variations in SoCs
Mitsuya Fukazawa, Tetsuro Matsuno, Toshifumi Uemura, Rei Akiyama, Tetsuya Kagemoto, Hiroshi Makino, Hidehiro Takata, Makoto Nagata · 2007
Fine-grained built-in probing circuits are distributed at 120 locations on the SoC to allow continuous-time monitoring of power-supply variations. On-die high-precision sampling circuits with 800muV/100ps resolution allow probing of 26 chip-wide locations of the CPU core including SRAM modules. Analog waveforms and peak-voltage measurements show confirmation of dynamic operation-mode transitions.