A BIST scheme for an SNR test of a sigma-delta ADC
M.F. Toner, Gordon Walter Roberts · 2002
Built-In-Self-Test (BIST) for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means to perform in-the-field diagnostics. This paper discusses a mixed analog-digital BIST (MADBIST) for a signal-to-noise-ratio test of an analog-to-digital converter. The MAD-BIST strategy for the SNR test of the A/D converter is introduced, accuracy issues are discussed, and experimental results are presented.>