A framework for evaluating test pattern generation strategies
Tracy Larrabee · 2003
A formal approach for the analysis of heuristics used in automatic test pattern generation for combinational circuits is presented. A test pattern generation system that constructs a satisfying assignment for a Boolean formula describing the legal set of tests is discussed. Heuristics as modifications to the formula or the satisfier acting on the formula are described. Experimental results are provided for the system as a whole, and for the effects of four heuristics.>