A genetic approach to test generation for logic circuits
T. Hayashi, H. Kita, Kazumi Hatayama · 2002
This paper presents a genetic algorithm to generate tests for logic circuits. Bit strings corresponding to primary input patterns are evolved into tests for detecting a target fault by genetic operations. Some new techniques, such as a crossover operation based on fault-excitability and fault-drivability, are introduced to achieve high fault coverage. Experimental results show that the genetic approach is effective for solving test generation problem.>