Can IDDQ test replace conventional stuck-fault test?
David Wu · 2002
Defect analysis of CMOS circuits is performed to show the test effectiveness of IDDQ testing. Results show that the test patterns generated by the stuck-fault model can detect nearly 100% of stuck-at faults and a very high percentage of delay faults and stuck-open faults. The IDDQ testing technique can detect gate oxide shorts, bridging faults, and some delay faults. However, IDDQ tests do not guarantee the improvement of stuck-at fault test coverage and they cannot detect the majority of delay defects and open defects.>