The Study Of Improved RWPA For The Multiple-Core Chip
Cao Xing, Zhang Jinyi, Ren Xiaojun · 2005
Along with the development of the multi-core system, the testability of circuit faces many new challenges. Relay wave propagation test of arrays (RWPA) has many advantages in single-chain and multi-chain boundary scan (BS) circuit. In this paper, the improved single-chain RWPA is tentatively applied to the multi-core BS architecture, to reduce the test time and increase the fault coverage. As an experiment, it is applied to the BS circuit of VAD-SOC which has multiple cores in the system for verifying the advantages of this scheme