Wavelet despiking of fractographs
Jean-Marie Aubry, Naoki Saito · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000
Fractographs are elevation maps of the fracture zone of some broken material. The technique employed to create these maps often introduces noise composed of positive or negative 'spikes' that must be removed before further analysis. Since the roughness of these maps contains useful information, it must be preserved. Consequently, conventional denoising techniques cannot be employed. We use continuous and discrete wavelet transforms of these images, and the properties of wavelet coefficients related to pointwise Hoelder regularity, to detect and remove the spikes.