Built in test (BIT) in a commercial signal generator
G.L. Sprader · 2003
The implementation of internal diagnostics in Hewlett-Packard's newest series of RF signal generator products is described. Using an assembly-level repair support strategy, it is possible to repair most instrument failures quickly without the use of external test equipment. Testing of individual assemblies in the instrument is done with a series of analog multiplexers, an internal voltmeter with AC and DC measurement capability, and an internal RF power meter. An interactive troubleshooting mode is used to find problems in the interconnections between assemblies.>