Accuracy requirements in at-speed functional test
Burnell G. West · 2003
This paper analyzes the requirements of at-speed functional testing of high-speed devices. We conclude that, although the requirement forecast by the International Technology Roadmap for Semiconductors is excessive, higher accuracy at-speed functional test systems are needed to qualify the high-performance devices anticipated in the next decade. We also conclude that, while challenging, the necessary higher speeds and accuracies can be realized.