Random limited-scan to improve random pattern testing of scan circuits
Irith Pomeranz · 2001
We propose a method of random pattern generation for at-speed testing of circuits with scan. The proposed method uses limited scan operations to achieve complete fault coverage. Under a limited scan operation, the circuit state is shifted by a number of positions which may be smaller than the number of state variables. Limited scan operations are inserted randomly to ensure that the complete test set can be generated by a random pattern generator with simple control logic. 1.