A Generic Framework for Scan Capture Power Reduction in Test Compression Environment
Xiao Liu, Feng Yuan, Qiang Xu · 2008
This work proposes a generic framework for reducing scan capture power in test compression environment. Using the entropy of the test set to measure the impact of capture power-aware X-filling on the potential test compression ratio, the proposed method is able to keep capture power under a safe limit with little loss in test compression ratio.