Automatic test generation for functional verification of microprocessors
Jiro Miyake, G. Brown, Masaaki Ueda, T. Nishiyama · 2002
A novel method to generate test programs for functional verification of microprocessors is presented. The method combines schemes of random generation and specific sequence generation. Four levels of hierarchical information are used to generate efficient test programs including many complicated sequences. Considerations in the test generation is also discussed.>