2.4GHz 7mW all-digital PVT-variation tolerant True Random Number Generator in 45nm CMOS
Suresh Srinivasan, Sanu K. Mathew, Rajaraman Ramanarayanan, Farhana Sheikh, Mark A Anders, Himanshu Kaul, Vasantha Erraguntla, Ram Kumar Krishnamurthy, G. Taylor · 2010
An all-digital True Random Number Generator is fabricated in 45nm CMOS with 2.4Gbps random bit throughput and total power consumption of 7mW. Two-step coarse/fine-grained tuning with a self-calibrating feedback loop enables robust operation in the presence of 20% process variation while providing immunity to run-time voltage and temperature fluctuations. The 100% digital design enables a compact layout occupying 4004μm2with measured entropy of 0.999965, and scalable operation down to 280mV, while passing all NIST RNG tests.