Quick method for test sequence generating for datapath
Andrei G. Karatkevich · International Conference on Experience of Designing and Applications of CAD Systems in Microelectronics · 2011
In this paper a heuristic method of generation of a sequence of microinstructions testing all connections (ways of direct sending of data) in a data path is presented. Such sequence is a necessary element of test bench. Length of the sequence is minimized. The method is oriented for microprocessors, microcontrollers and other digital systems with clearly separated control unit and datapath. An example of application of proposed method is given.