Built-in self-test of bit-serial arithmetic units for digital signal processing
Hans O. Kreken, E.J. Aas · 2002
Bit-serial multipliers with fixed coefficients are commonly exploited in area efficient DSP applications. Built-In Self-Test is a viable technique for high quality testing. We present and analyze a very area efficient BIST technique based on normal or inverted output-to-input feedback. Testing is employed at system speed.