Calculation of parameter values from node voltage measurements
Timothy N. Trick, Wataru Mayeda, Adel A. Sakla · IEEE Transactions on Circuits and Systems · 1979
In this paper a theorem is given for the necessary and sufficient test conditions required to determine the value of a circuit component from node voltage measurements at a single test frequency. Several techniques are then presented for the calculation of circuit component values from voltage measurements, including a new technique based on the adjoint circuit concept. In addition, some results are presented on the measurement of component values using different test frequencies.