Embedded software-based self-testing for SoC design
A. Krstić, Wei-Cheng Lai, Kwang-Ting Tim Cheng, L. Chen, S. Dey · Proceedings - ACM IEEE Design Automation Conference · 2002
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high-performance testers and increasing yield loss caused by inherent tester inaccuracy. Therefore, empowering the chip to test itself seems like a natural solution. Hardware-based self-testing techniques have limitations due to performance and area overhead and problems caused by the application of non-functional patterns.Embedded software-based self-testing has recently become focus of intense research. In this methodology, the programmable cores are used for on-chip test generation, measurement, response analysis and even diagnosis. After the programmable core on a System-on-Chip (SoC) has been self-tested, it can be reused for testing on-chip buses, interfaces and other non-programmable cores. The advantages of this methodology include at-speed testing, low design-for-testability overhead and application of functional patterns in the functional environment. In this paper, we give a survey and outline the roadmap and challenges of this emerging embedded software-based self-testing paradigm.