Self-testable full range window comparator
Yubin Zhang, M.W.T. Wong · 2004
In this paper, a novel full range window comparator with self-testability feature is presented. The use of a mixed-signal full range window comparator for built-in-self-test (BIST) of analogue cores in system-on-chip (SOC) was described in. Therefore we leverage on the design effort already spent in providing an effective means of testing SOCs, by making the comparator self-testable hence the potential problem of a faulty comparator circuit during test mode operation is greatly reduced.